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EDNAbout Us·Subscribe to NewslettersDESIGN CENTERSLatestAnalogAutomotiveComponents|PkgingConsumerDesignConDIYIC DesignLEDsMedicalPCBPower ManagementSensorsSystems DesignTest|MeasurementWireless|NetworkingLoading...TOOLS & LEARNINGLatestDesign ToolsProductsTeardownsFundamentals CoursesWebinarsTech PapersCoursesEDN TVMouser New ProductsLoading...COMMUNITYLatestBlogsDesign IdeasEventsLoading...CONNECT WITH EDNON TWITTERON FACEBOOKON LINKEDINEDN VAULTLatestCollections Issue ArchivesLoading...SearchDESIGN CENTERSAnalogAutomotiveComponents|PkgingConsumerDIYIC DesignLEDsMedical PCBPower ManagementSensorsSystems DesignTest|MeasurementWireless|NetworkingTOOLS & LEARNINGDesign ToolsProductsTeardownsFundamentals CoursesWebinarsTech PapersCourses Mouser New ProductsCOMMUNITYBlogs Design IdeasEventsEDN VAULTCollections Issue ArchivesHome> Test-and-measurement Design CenterTest & MeasurementMartin RoweSenior Technical EditorView Profile ·About Test & MeasurementTechnical information about test and measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.FEATUREDDESIGN IDEASPRODUCTSTEARDOWNSDESIGN ARTICLESBLOGSReview: Tektronix RSA306 spectrum analyzer (part 1)11.28.2014·type: Blog·Save & FollowSave to My LibraryFollow CommentsFollow AuthorThe spectrum analyzer has always been a vital tool for the EMC engineer. Until the last few years, these instruments have been rather large and heavy desktop instruments, weighing up to 60 pounds, or more. With the breakthroughs in components used for wireless technology, the size and weight of these instruments has decreased dramatically. In this review, we'll check out the new Tektronix RSA306 spectrum analyzer and run it through its paces. Read More...Design for test boot camp, part 3: Advanced fault models and cell-aware test11.25.2014·type: Blog·Save & FollowSave to My LibraryFollow CommentsFollow AuthorFault models must cover a variety of defects such as IDDQ, shorts and opens, and delay defects. Read More...Test challenges for USB 3.1 SuperSpeedPlus11.25.2014·type: How To Article·Save & FollowSave to My LibraryFollow CommentsFollow AuthorTesting for USB 3.1 involves not only measuring traditional eye diagrams, but also RF analysis using spectrum analyzers, time domain reflectometry, transmission characterization using S-parameters, and the new requirement for loopback receiver testing. Here's how to do it. Read More...10 More tricks to extend oscilloscope usefulness11.21.2014·type: How To Article·Save & FollowSave to My LibraryFollow CommentsFollow AuthorMake yourself look like the company's oscilloscope expert with these ten handy tips and tricks. Read More...LXI + PoE:
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